Principal test engineer
Pubblicato il 17-08-2026 - Renesas Electronics in Italia
Job Description Renesas is seeking a highly experienced Principal Test Engineer to drive advanced test development for new products within the Performance Computing Power (PCP) business unit in Catania, Italy. This role is a key technical position combining deep hands‑on expertise with strategic influence across product development and production. As a senior individual contributor, the selected candidate will define and lead test methodologies, guide complex technical decisions, and act as a reference point for the broader engineering team. You will work on cutting‑edge power management solutions, including multi‑phase controllers, smart power stages, and 48 V system power regulators. Key Responsibilities Lead end-to-end test strategy definition for new product development, ensuring scalability, quality, and cost efficiency Define and drive adoption of best‑in‑class test methodologies, test plan development, DFT approaches, and ATE hardware design Act as technical leader and mentor for test engineers, supporting capability growth across the team Ensure robust production release ,
including high coverage, test time optimization, and manufacturability Lead root cause analysis and yield improvement initiatives , applying advanced statistical and data‑driven techniques Collaborate cross‑functionally with Design, Product Engineering, Operations, and Quality teams worldwide Provide technical leadership in customer interactions, escalations, and quality investigations Influence test roadmap and long‑term strategy , aligning with business and product requirements Support cost reduction initiatives through test optimization and efficiency improvements Qualifications Bachelor’s degree in electrical/computer engineering (master’s preferred) Typically 12+ years of experience in test engineering for analog/mixed‑signal or power management ICs Extensive expertise in ATE test development (Advantest 93 K, Teradyne/Eagle, SPEA, COHU) Strong knowledge of DFT techniques, test coverag