Sr. Applied Scientist, WWOS Tech
Pubblicato il 01-10-2026 - Amazon in Italia
Have you ever wanted to solve a mystery or be part of solving a case? Are you fascinated by detective stories or crime shows on TV? Do you love to catch bad actors, build ML models and solve complex problems. If so, working on the WWOS Tech team as an Applied Scientist is the place for you We detect theft, fraud and organized crime happening across our global supply chain and operations for millions of items, for hundreds of product lines worth billions of dollars of inventory world-wide. We foster new game-changing ideas, creating ever more intelligent and self-learning systems to maximize the cost savings of Amazon's inventory losses. The primary role of an Applied Scientist within Amazon is to address business challenges through building a compelling case, and using data to influence change across the organization. This individual will be given responsibility on their first day to own those business challenges and the autonomy to think strategically and make data driven decisions. Decisions and tools made in this role will have significant impact to the customer experience,
as it will have a major impact on all the fraud investigations happening across Amazon operations. Ideal candidates will be a high potential, strategic and analytic graduate with a PhD in ( Research, Statistics, Engineering, and Supply Chain) ready for challenging opportunities in the core of our world class operations space. Great candidates have a history of building fraud detections, detecting organized crime and the ability to use data and research to make changes. This individual will need to be able to work with a team, but also be comfortable making decisions independently, in what is often times an ambiguous environment.
Key job responsibilities
- Own KPIs that measure theft/fraud management performance and efficiencies.
- Detect and automate theft, fraud MOs
- Detect organized crime rings and bad actor clusters
- Perform end to end evaluation of operational defects, system gaps, and s