16 ott - Pavia
LHH
Overview As a Product Test Engineer at a leading semiconductor company, you will strengthen the full test lifecycle of devices, driving automation, test program optimization, and yield improvements. You will collaborate with manufacturing, R&D;, quality, and data science to ensure robust and efficient production. Your work includes implementing smart burn-in sampling, capacitive testing, and data-driven analysis to resolve customer incidents and prevent recurrences. This role offers the chance to shape test methodologies and reduce cycle time in a dynamic, global environment. You will contribute to high-quality manufacturing and continuous improvement in product reliability.
Responsabilità
Develop automation workflows and test programs to streamline lot processing Support new package and new product introductions through test program optimization and yield improvement Optimize test flows to reduce cycle time while maintaining accuracy and quality Implement smart burn-in sampling using data science insights to skip certain burn-in units Introduce capacitive testing to enhance detection of wire proximity conditions Evaluate yield metrics and define improvement plans for production efficiency Provide timely support for customer incidents with analysis, resolution, and follow-up Analyze data from hold lots to identify patterns or anomalies Perform root cause analysis on hold lots and implement preventive actions
Requisiti fondamentali
Master's degree in Electronics or related field Experience in test engineering, semiconductor manufacturing, or automation is advantageous Knowledge of test program development and test methodologies (functional, parametric, capacitive) Proficiency in C programming language is an asset Willingness to learn and grow technical skills with new equipment Strong problem-solving mindset, attention to detail Ability to work in cross-functional teams strong problem-solving mindset attention to detail cross-functional collaboration test program development test methodologies: functional, parametric, capacitive testing automation
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