Manager, Product and Test Engineering
Pubblicato il 28-10-2026 - Allegro Microsystems in Monza
Overview
In this role you lead a high-performing Test Engineering team in Milan, owning test strategy, silicon validation, and transition to production for high-voltage semiconductor products. You will drive DFT collaboration, ATE hardware/software development, and product characterization to ensure quality and manufacturability. You will influence cross-functional teams and global manufacturing partners to optimize yields and reliability in a fast-paced, automotive-focused environment. This is a hands-on leadership role with a direct impact on product release quality and operational excellence.
Retribuzione / Benefits
- Total Rewards package
- base salary plus premio
- local market alignment
- competitive compensation
- career development
- annual review tied to performance
Responsabilità
- Lead and grow a team of Test Development and Product Engineers
- Define and implement wafer probe and final packaged test strategies for high-voltage ICs
- Oversee ATE load boards, probe cards, and test programs using Teradyne ETS/Eagle 364 or similar
- Collaborate with IC Design and Systems Engineering to define DFT methods (digital scan, Iddq, SHOVE, GateStress)
- Drive Silicon Review and full electrical characterization across temperature and process corners
- Ensure smooth Pre-Production Release to Release to Production per automotive/industrial standards
- Partner with global manufacturing and foundry teams to monitor yields and drive yield improvements
Requisiti fondamentali
- 8+ years in semiconductor Test Engineering
- Experience leading or supervising engineering teams
- Strong background in analog, mixed-signal, or high-voltage power IC testing
- Strategic communicator
- Collaborative builder across geographies and functions
- Problem solver with analytical mindset
- ATE test program development
- Hardware design for test boards (schematics, PCB layout)
- High-voltage testing challenges (isolation barriers, partial discharge, transient measurements)